, and various gains) to be set independently of those in the main scan controls.Interleave is an advanced feature of NanoScope software that allows the simultaneous acquisition of two data types. Enabling Interleave alters the scan pattern of the piezo: after the trace and retrace of each main scan line (in which topography is typically measured), a second trace and retrace is inserted to obtain non-topographical information.
The Interleave commands use a set of Interleave controls that allow several scan controls (Drive Amplitude, setpoint, and various gains) to be set independently of those in the main scan controls.
Typical applications of interleave scanning include Magnetic Force Microscopy (MFM) and Electric Force Microscopy (EFM) measurements. There are two forms of Interleave scanning available:
Enabling Interleave with the mode set to Lift enacts LiftMode. During the interleave scan, the feedback is turned off and the tip is lifted to a user-selected height above the surface to perform far field measurements such as magnetic or electric forces. By recording the cantilever deflection or resonance shifts caused by the magnetic or electric forces on the tip, an image map of force changes can be produced. LiftMode was developed to isolate purely MFM and EFM data from topographic data.
Interleave can also be used in Interleave Mode. In this mode, the feedback is kept on while additional topography, phase lateral force, or data is acquired.
For more background information see How Interleave Mode Works. For operator instructions, see Operation of Interleave Scanning and LiftMode and Use of LiftMode with TappingMode.
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